Tetragraphene (TG) is a quasi-2D semiconductor carbon allotrope composed of hexagonal and tetragonal rings and shows metallic or semiconducting behaviors. This study uses molecular dynamics (MD) simulations to understand fracture properties of triple-layered TG sheets with two different structures under mixed mode I and II loading using the Tersoff–Erhart potential. We investigate the effect of crack edge chirality, loading phase angle, and temperature on the crack propagation path and critical stress intensity factors.
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