S10: Small Scale Specimen Testing


Small scale testing arises, both, from the need to evaluate miniaturised devices and location-specific properties in an inhomogeneous system, as well as from the need to combine in-operando methods of evaluation that combine loading with high resolution characterisation such as imaging, EBSD, x-ray microscopy/tomography, corrosive environments, irradiation and so on. Whether due to overall dimensions or constraints due to confinement, such small samples are known to differ in their fracture behaviour from their bulk counterparts. This affects the assessment of their structural integrity and mechanical reliability.

This symposium focusses on the various testing methods developed to probe the fracture behaviour of materials and structures at small length scales under different monotonic, cyclic and dynamic loading conditions and environments. The challenges and advantages of the different geometries, instrumentation for strain and other data collection, the associated modelling and simulation tools that are needed to complement potentially expensive and complex experiments are all topics of interest. Abstracts are welcome covering all classes of materials, including metals, ceramics, glasses, polymers, hierarchically structured (biological) materials, thin films / coatings and composites. Emerging trends in quantifiable fracture parameters of small-scale structures are also a topic of interest. The symposium will also examine roadmaps towards standardization of non-conventional small-scale testing to enhance their future applicability in engineering practice.

Confirmed Invited Speakers

Mikhail Sokolov (Oak Ridge National Laboratory, USA)

Jamie J Kruzic (University of New South Wales, Australia)

Daniel Kiener (Montanuniversität Leoben, Austria)

Christoph Kirchlechner (Karlsruhe Institute of Technology, Germany)

Praveen Kumar (Indian Institute of Science, India)

Chris Eberl (University of Freiburg and Fraunhofer Institute, Germany)


Nagamani Jaya Balila (Indian Institute of Technology, Bombay, India)

B. Gludovatz (University New South Wales, Australia)

Dan Gianola (University of California, Santa Barbara, USA)

Vikram Jayaram (Indian Institute of Science, India)

Rob Lancaster (University of Swansea, UK)

V Raghuprakash (Indian Institute of Technology, Madras, Inida)


Vikram Jayaram (email: qjayaram@iisc.ac.in)